Articles tagged with: Nist and Mems

Job-related stress: Fatigue effects in silicon

Researchers at the National Institute of Standards and Technology (nist) have demonstrated a mechanical fatigue process that eventually leads to cracks and breakdown in bulk silicon crystals - a phenomenon that's particularly interesting because it long has been thought not to exist. Their recently published results have important implications for the design of new silicon-based micro-electromechanical system (MEMS) devices which are increasingly used in application such as optical zooms on camera phones.  more

Related Tags: semiconductor